13 September 2002 Behaviors of free electrons and shallow-trapped electrons in sulfur-sensitized silver halide material
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Abstract
Photo-electron decay characteristics in imaging process directly decide photographic efficiency of AgX emulsion. Microwave Absorption and Dielectric Spectrum Measure Technique (MADSMT) is a powerful tool to detect the change of emulsion film illuminated by light Through detecting the changes of reflect voltage in MADSMT, the decay signals of free electrons and shallow-trapped electrons will be obtained. In our work, the sulfur-sensitized silver halide material samples are used, which are made in different conditions, for example different temperatures and different densities. In order to record the whole decay process, a YAG laser system whose pulse width is 35ps is used as an exposure light. Finally the mechanism of sulfur-sensitized centers has been discussed and the influence of different conditions has been compared and analyzed.
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Xiaodong Lu, Xiaodong Lu, Li Han, Li Han, Shaopeng Yang, Shaopeng Yang, Xiao-Wei Li, Xiao-Wei Li, Aicong Geng, Aicong Geng, } "Behaviors of free electrons and shallow-trapped electrons in sulfur-sensitized silver halide material", Proc. SPIE 4922, Color Science and Imaging Technologies, (13 September 2002); doi: 10.1117/12.483128; https://doi.org/10.1117/12.483128
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