5 September 2002 Development of AF/PSTM
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Abstract
According to author's Chinese invented patent ZL96 I II 979.9 named "The method of separating image of AF/PSTM (atom force and photon scanning tunneling microscope)", the first system ofAF/PSTM has been developed. Its principle, photograph, block diagram and some images ofan examination sample have been given in this paper. There are three advantages of this system: (1) AF/PSTM can eliminate the optical false image which caused by topography of sample in PSTM; (2) The optical images and topographic image of sample are separated with this AF/PSTM; (3) From once scanning imaging two optical images (refractive index image and transmissivity image) and two AFM images (topography image and phase or grads oftopography image) can be obtained.
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Shifa Wu, Shifa Wu, Jian Zhang, Jian Zhang, Yinli Li, Yinli Li, Wei Sun, Wei Sun, Kai Xu, Kai Xu, Yuqi Huang, Yuqi Huang, Shi Pan, Shi Pan, } "Development of AF/PSTM", Proc. SPIE 4923, Nano-Optics and Nano-Structures, (5 September 2002); doi: 10.1117/12.481728; https://doi.org/10.1117/12.481728
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