5 September 2002 Development of AF/PSTM
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According to author's Chinese invented patent ZL96 I II 979.9 named "The method of separating image of AF/PSTM (atom force and photon scanning tunneling microscope)", the first system ofAF/PSTM has been developed. Its principle, photograph, block diagram and some images ofan examination sample have been given in this paper. There are three advantages of this system: (1) AF/PSTM can eliminate the optical false image which caused by topography of sample in PSTM; (2) The optical images and topographic image of sample are separated with this AF/PSTM; (3) From once scanning imaging two optical images (refractive index image and transmissivity image) and two AFM images (topography image and phase or grads oftopography image) can be obtained.
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Shifa Wu, Shifa Wu, Jian Zhang, Jian Zhang, Yinli Li, Yinli Li, Wei Sun, Wei Sun, Kai Xu, Kai Xu, Yuqi Huang, Yuqi Huang, Shi Pan, Shi Pan, "Development of AF/PSTM", Proc. SPIE 4923, Nano-Optics and Nano-Structures, (5 September 2002); doi: 10.1117/12.481728; https://doi.org/10.1117/12.481728

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