20 September 2002 Method to measure reflection-induced retardance without compensator
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Abstract
The measurement of reflection-induced retardance of optical devices is the usual case encountered in optical research, development and engineering. This kind of measurement usually can be completed using a linear polarizer and a retarder. A novel method used for the measurement of reflection-induced retardance employing a polarizer and an analyzer is proposed in this paper, the theoretical analysis of the method and an application example are given.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zheng Ping Wang, Zheng Ping Wang, Qingbo Li, Qingbo Li, Huili Wang, Huili Wang, Ruiying Feng, Ruiying Feng, Zongjun Huang, Zongjun Huang, Xin Yu, Xin Yu, Jinhui Shi, Jinhui Shi, } "Method to measure reflection-induced retardance without compensator", Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); doi: 10.1117/12.464300; https://doi.org/10.1117/12.464300
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