Multiwavelength high-thermometry using spectrum analysis

Xinmin Qi; Yiqing Gao; Huanming Chen; Lihua Yuan; Xiaojin Zhu; Jian Xing

doi:10.1117/12.471212

20 September 2002 Research of multiwavelength high-thermometry using spectrum analysis

Xinmin Qi, Yiqing Gao, Huanming Chen, Lihua Yuan, Xiaojin Zhu, Jian Xing

Proceedings Volume 4927, Optical Design and Testing; (2002) https://doi.org/10.1117/12.471212
Event: Photonics Asia, 2002, Shanghai, China

Abstract

The formula of bi-wavelength-thermometry is given, which is used for characteristic signal process of arc plasma thermometry and its distribution. The principle of spectrometer is introduced simply. Through experiment research of the three kinds of current measuring ways, a method of spectrum measurement using multi-wavelength scan is presented, which is in favor of studying the spatial distribution of the thermal plasma field thoroughly.

Citation Download Citation

Xinmin Qi, Yiqing Gao, Huanming Chen, Lihua Yuan, Xiaojin Zhu, and Jian Xing "Research of multiwavelength high-thermometry using spectrum analysis", Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); https://doi.org/10.1117/12.471212

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