20 September 2002 Research of multiwavelength high-thermometry using spectrum analysis
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Proceedings Volume 4927, Optical Design and Testing; (2002); doi: 10.1117/12.471212
Event: Photonics Asia, 2002, Shanghai, China
Abstract
The formula of bi-wavelength-thermometry is given, which is used for characteristic signal process of arc plasma thermometry and its distribution. The principle of spectrometer is introduced simply. Through experiment research of the three kinds of current measuring ways, a method of spectrum measurement using multi-wavelength scan is presented, which is in favor of studying the spatial distribution of the thermal plasma field thoroughly.
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Xinmin Qi, Yiqing Gao, Huanming Chen, Lihua Yuan, Xiaojin Zhu, Jian Xing, "Research of multiwavelength high-thermometry using spectrum analysis", Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); doi: 10.1117/12.471212; https://doi.org/10.1117/12.471212
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KEYWORDS
Plasma

Spectroscopy

Thermometry

Signal processing

Optical filters

Receivers

Charge-coupled devices

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