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20 September 2002 Real-time far distance micro-vibration measurement using an external cavity semiconductor laser interferometer with a feedback control system
Weirui Zhao, Pengfei Jiang, Fuzeng Xie
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Proceedings Volume 4927, Optical Design and Testing; (2002) https://doi.org/10.1117/12.471707
Event: Photonics Asia, 2002, Shanghai, China
Abstract
An external cavity semiconductor laser interferometer used to measure far distance micro-vibration in real time is proposed. In the interferometer, a single longitudinal mode and excellent coherent characteristic grating external cavity semiconductor laser is constructed and acted as a light source and a phase compensator. Its coherent length exceeds 200 meters. The angle between normal and incidence beam of the far object is allowed to change in definite range during the measurement with this interferometer, and this makes the far distance interference measurement easier and more convenient. Also, it is not required to keep the amplitudes of the first and second harmonic components equal, and then the dynamic range is increased. A feedback control system is used to compensate the phase disturbance between the two interference beams introduced by environmental vibration.
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Weirui Zhao, Pengfei Jiang, and Fuzeng Xie "Real-time far distance micro-vibration measurement using an external cavity semiconductor laser interferometer with a feedback control system", Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); https://doi.org/10.1117/12.471707
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KEYWORDS
Semiconductor lasers
Interferometers
Distance measurement
Modulation
Control systems
Feedback control
Linear filtering
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