Paper
16 September 2002 Pattern recognition for optical PSI images of surface topography using wavelets
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Abstract
This paper proposes a novel philosophical approach using Wavelet and Radon Transform for addressing topographical features of surface from a PSI image. In this work, a combined technique using the Wavelet and Radon Transforms has been investigated and developed to achieve the forensic dissection of PSI image data. As a result, the isolated point-like features on a PSI image can be extracted using the wavelet transform with artifact free thresholding method, and the curve-like features on a PSI image can be identified using the Ridgelet Transform (Multi-Wavelet-Radon transform). Case studies are conducted using a series of femoral heads to demonstrate the application of using the new wavelet model in the assessment PSI images of these surfaces.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiangqian Jiang, Shaojun Xiao, and Liam Blunt "Pattern recognition for optical PSI images of surface topography using wavelets", Proc. SPIE 4929, Optical Information Processing Technology, (16 September 2002); https://doi.org/10.1117/12.483206
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Wavelets

Radon transform

Feature extraction

Wavelet transforms

Head

Continuous wavelet transforms

Discrete wavelet transforms

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