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17 September 2002 Study of near-field aperture property of a nanometer AgOx thin film
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Abstract
AgOx thin-films were studied by using an optical read-write-tester. Two different states were found by CCD and SEM images, and the optical properties were examined by the pump-probe technique. A scattering center was found in the AgOx thin film. The enhanced reflectance was due to strongly local scattering and plasmon excitations.
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Fu Han Ho, Hsun Hao Chang, Yu Hsaun Lin, and Din Ping Tsai "Study of near-field aperture property of a nanometer AgOx thin film", Proc. SPIE 4930, Advanced Optical Storage Technology, (17 September 2002); https://doi.org/10.1117/12.483309
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