Electrochromism of sputtered nickel oxide films

Xuping Zhang; Jieying Tang; Yueming Sun

doi:10.1117/12.483328

17 September 2002 The Electrochromism of sputtered nickel oxide films

Xuping Zhang, Jieying Tang, Yueming Sun

Proceedings Volume 4930, Advanced Optical Storage Technology; (2002) https://doi.org/10.1117/12.483328
Event: Photonics Asia, 2002, Shanghai, China

Abstract

The X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) were used to analysis the chemical composition and valence of sputtered electrochromic nickel oxide films is as-deposited, fully bleached and colored states. Experimental results showed that no Ni(OH)₂ exists in these three states. Potassium adsorbs at the NiO film surface instead of entering the lattice of nickel vacancies when the nickel oxide films were coloring/bleaching cycled in KOH solution. And the chemical valence of Ni does not seem to change after coloring and bleaching. A new electrochromism for sputtered nickel oxide films in aqueous electrolytes is proposed.

Citation Download Citation

Xuping Zhang, Jieying Tang, and Yueming Sun "The Electrochromism of sputtered nickel oxide films", Proc. SPIE 4930, Advanced Optical Storage Technology, (17 September 2002); https://doi.org/10.1117/12.483328

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