PROCEEDINGS VOLUME 4932
XXXIV ANNUAL SYMPOSIUM ON OPTICAL MATERIALS FOR HIGH POWER LASERS: BOULDER DAMAGE SYMPOSIUM | 16-18 SEPTEMBER 2002
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
IN THIS VOLUME

6 Sessions, 80 Papers, 0 Presentations
Thin Films  (10)
Section  (16)
XXXIV ANNUAL SYMPOSIUM ON OPTICAL MATERIALS FOR HIGH POWER LASERS: BOULDER DAMAGE SYMPOSIUM
16-18 September 2002
Boulder, CO, United States
Fundamental Mechanisms
Proc. SPIE 4932, Calculation of electric field intensity at dielectric interfaces, 0000 (30 May 2003); doi: 10.1117/12.472032
Proc. SPIE 4932, Accuracy and repeatability of laser damage threshold measurements made via order statistics, 0000 (30 May 2003); doi: 10.1117/12.472035
Proc. SPIE 4932, Trapping of electrical charges and laser damage, 0000 (30 May 2003); doi: 10.1117/12.472037
Surfaces and Mirrors
Proc. SPIE 4932, Identification and elimination of fluorescent surface-damage precursors on DKDP optics, 0000 (30 May 2003); doi: 10.1117/12.472041
Proc. SPIE 4932, Methods for mitigating growth of laser-initiated surface damage on DKDP optics at 351 nm, 0000 (30 May 2003); doi: 10.1117/12.472047
Fundamental Mechanisms
Proc. SPIE 4932, Analysis of raster scanning damage and conditioning experiments, 0000 (30 May 2003); doi: 10.1117/12.472048
Surfaces and Mirrors
Proc. SPIE 4932, Mechanisms of CO2 laser mitigation of laser damage growth in fused silica, 0000 (30 May 2003); doi: 10.1117/12.472049
Proc. SPIE 4932, Overview of raster scanning for ICF-class laser optics, 0000 (30 May 2003); doi: 10.1117/12.472050
Materials and Measurements
Proc. SPIE 4932, Effects of pulse duration on bulk laser damage in 350-nm raster-scanned DKDP, 0000 (30 May 2003); doi: 10.1117/12.472051
Thin Films
Proc. SPIE 4932, Influence of BK7 substrate solarization on the performance on hafnia and silica multilayer mirrors, 0000 (30 May 2003); doi: 10.1117/12.472052
Surfaces and Mirrors
Proc. SPIE 4932, Large-spot COIL irradiation of Ge samples, 0000 (30 May 2003); doi: 10.1117/12.472054
Proc. SPIE 4932, Environmental effects on optical component aging, 0000 (30 May 2003); doi: 10.1117/12.472055
Proc. SPIE 4932, Influence of 527-nm laser light on debris- and shrapnel-contaminated optical surfaces, 0000 (30 May 2003); doi: 10.1117/12.472056
Thin Films
Proc. SPIE 4932, Investigation of high-power laser beam-, plasma-, debris-, and shrapnel-induced damage of optical coatings on the HELEN laser facility, 0000 (30 May 2003); doi: 10.1117/12.472057
Fundamental Mechanisms
Proc. SPIE 4932, Self-focusing and rear surface damage in a fused silica window at 1064 nm and 355 nm, 0000 (30 May 2003); doi: 10.1117/12.472374
Proc. SPIE 4932, Bulk damage and laser conditioning of KDP and DKDP crystals with Xe-F excimer light and the 3w of a Nd:Yag laser, 0000 (30 May 2003); doi: 10.1117/12.472384
Materials and Measurements
Proc. SPIE 4932, Growth of damage sites due to platinum inclusions in Nd-doped laser glass irradiated by the beam of a large-scale Nd:glass laser, 0000 (30 May 2003); doi: 10.1117/12.472433
Surfaces and Mirrors
Proc. SPIE 4932, Parametric study of the growth of damage sites on the rear surface of fused silica windows, 0000 (30 May 2003); doi: 10.1117/12.472435
Fundamental Mechanisms
Proc. SPIE 4932, Modified Z-scan method for determination of nonlinear refraction of optical materials through the measurement of power-weighted time-averaged beam propagation factor, 0000 (30 May 2003); doi: 10.1117/12.472481
Proc. SPIE 4932, Ultrashort pulse damage of Si and Ge semiconductors, 0000 (30 May 2003); doi: 10.1117/12.472053
Proc. SPIE 4932, Synchrotron-radiation-induced damages in optical materials, 0000 (30 May 2003); doi: 10.1117/12.472487
Surfaces and Mirrors
Proc. SPIE 4932, Dependence of surface damage resistance on bulk quality in CsLiB6O10 (CLBO) crystal, 0000 (30 May 2003); doi: 10.1117/12.472386
Proc. SPIE 4932, Wet etching for the mitigation of laser damage growth in fused silica, 0000 (30 May 2003); doi: 10.1117/12.472389
Fundamental Mechanisms
Proc. SPIE 4932, Luminescence of UV thin films, 0000 (30 May 2003); doi: 10.1117/12.472391
Thin Films
Proc. SPIE 4932, Calculated and thermally measured laser damage in metallic thin films as a function of pulse duration, 0000 (30 May 2003); doi: 10.1117/12.472394
Surfaces and Mirrors
Proc. SPIE 4932, Long-term performances of very high-laser-damage resistant mirrors, 0000 (30 May 2003); doi: 10.1117/12.472401
Thin Films
Proc. SPIE 4932, Optical characteristics of THV fluorothermoplastic (Abstract Only), 0000 (30 May 2003); doi: 10.1117/12.472404
Proc. SPIE 4932, Nodular defects in sputtered coatings, 0000 (30 May 2003); doi: 10.1117/12.472405
Fundamental Mechanisms
Proc. SPIE 4932, Comparison of numerical simulations with experiment on generation of craters in silica by a laser, 0000 (30 May 2003); doi: 10.1117/12.472406
Proc. SPIE 4932, Using a TOF mass spectrometer for studies of laser interaction with 3-nm diameter gold nanoparticles embedded in silica, 0000 (30 May 2003); doi: 10.1117/12.472407
Proc. SPIE 4932, Numerical simulations of laser/defect-induced absorption in SiO2, 0000 (30 May 2003); doi: 10.1117/12.472408
Materials and Measurements
Proc. SPIE 4932, Experimental results of laser interaction with included gold particles in silica at 1w and 3w (Abstract Only), 0000 (30 May 2003); doi: 10.1117/12.472410
Fundamental Mechanisms
Proc. SPIE 4932, Toward an absolute measurement of LIDT, 0000 (30 May 2003); doi: 10.1117/12.472411
Proc. SPIE 4932, Electromagnetic phenomena generated in laser-produced plasmas (Abstract Only), 0000 (30 May 2003); doi: 10.1117/12.472413
Proc. SPIE 4932, Self-guiding, supercontinuum generation and damage in bulk materials induced by femtosecond pulses, 0000 (30 May 2003); doi: 10.1117/12.472427
Proc. SPIE 4932, Identification of point defects responsible for laser-induced ultraviolet absorption in LiB3O5 (LBO) crystals, 0000 (30 May 2003); doi: 10.1117/12.472429
Proc. SPIE 4932, Experimental study of wavelength-dependent damage threshold in DKDP, 0000 (30 May 2003); doi: 10.1117/12.472431
Materials and Measurements
Proc. SPIE 4932, Evolution of bulk damage initiation in DKDP crystals, 0000 (30 May 2003); doi: 10.1117/12.472409
Thin Films
Proc. SPIE 4932, Femtosecond damage threshold of multilayer metal films, 0000 (30 May 2003); doi: 10.1117/12.472412
Surfaces and Mirrors
Proc. SPIE 4932, Operation of the Jefferson Lab FEL: optics lessons learned, 0000 (30 May 2003); doi: 10.1117/12.472428
Thin Films
Proc. SPIE 4932, Ion-assisted versus nonion-assisted high-laser-damage resistant coatings on BBO (Abstract Only), 0000 (30 May 2003); doi: 10.1117/12.472430
Fundamental Mechanisms
Proc. SPIE 4932, Photothermal microscopy for in-situ study of laser damage induced by gold inclusions, 0000 (30 May 2003); doi: 10.1117/12.472434
Thin Films
Proc. SPIE 4932, Photochemical laminating of low-refractive-index transparent antireflective SiO2 film, 0000 (30 May 2003); doi: 10.1117/12.472489
Materials and Measurements
Proc. SPIE 4932, Radiation resistance of optical materials against synchrotron radiation, 0000 (30 May 2003); doi: 10.1117/12.473160
Fundamental Mechanisms
Proc. SPIE 4932, Optical limiting based on liquid-liquid immiscibility, 0000 (30 May 2003); doi: 10.1117/12.473580
Section
Proc. SPIE 4932, Calibration of laser power meters for high-power applications, 0000 (30 May 2003); doi: 10.1117/12.473959
Materials and Measurements
Proc. SPIE 4932, Interferometric assessment of laser-induced damage to semiconductors, 0000 (30 May 2003); doi: 10.1117/12.474855
Thin Films
Proc. SPIE 4932, Degradation of a multilayer dielectric filter as a result of simulated space environmental exposure, 0000 (30 May 2003); doi: 10.1117/12.474853
Materials and Measurements
Proc. SPIE 4932, Application of spectroscopic ellipsometry to characterization of optical thin films, 0000 (30 May 2003); doi: 10.1117/12.474854
Thin Films
Proc. SPIE 4932, Damage behavior of SiO2 thin films containing gold nanoparticles lodged at predetermined distances from the film surface, 0000 (30 May 2003); doi: 10.1117/12.480065
Surfaces and Mirrors
Proc. SPIE 4932, Comparison of antireflective coated and uncoated surfaces figured by pitch-polishing and magnetorheological processes, 0000 (30 May 2003); doi: 10.1117/12.480213
Section
Proc. SPIE 4932, Laser beam characterization in uniaxial crystals, 0000 (30 May 2003); doi: 10.1117/12.472002
Mini-Symposium on Optics Characterization
Proc. SPIE 4932, Characterization of particulate contamination of optics, 0000 (30 May 2003); doi: 10.1117/12.472003
Section
Proc. SPIE 4932, Laser radiometry for UV lasers at 193 nm, 0000 (30 May 2003); doi: 10.1117/12.472004
Mini-Symposium on Optics Characterization
Proc. SPIE 4932, Results of a round-robin experiment on reflectivity measurments at a wavelength of 1.06 micron, 0000 (30 May 2003); doi: 10.1117/12.472005
Section