This paper will develop the expression for the electric field in the vicinity of a dielectric interface. This work is an extension of previous calculations that specifically applied to total internal reflection (TIR) interfaces. This paper will show that some differences should be expected in damage thresholds for s and p polarization. Explicit derivation for a generalized interface will be given and previous work generalized to include sub and super critical angle reflection and reflection from non TIR components.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan W. Arenberg, Jonathan W. Arenberg, } "Calculation of electric field intensity at dielectric interfaces (Abstract Only)", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472032; https://doi.org/10.1117/12.472032

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