30 May 2003 Characterization device for diode-laser-stack beam propagation
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Abstract
High beam quality can be achieved by accurate adjustment of the mechanical and micro-optical components in the manufacturing process of high power diode laser stacks. A charaterization device which can determine these parameters by automatically measuring the radiation properties of high-power diode-laser stacks has been developed. The result is a mechanically robust, easy to use characterization device of high reliability suited for applications in quality control and product optimization.
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Markus Roehner, Holger Muentz, Olaf Schroeder, Konstantin Boucke, Reinhart Poprawe, "Characterization device for diode-laser-stack beam propagation", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472390; https://doi.org/10.1117/12.472390
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