Abstract
The specification and characterization of particulate contamination is an area of active interest for ISO TC172/SC9/WG6. The starting point for the development of a new ISO standard is the US national standard, MIL-STD-1246. The paper will discuss the basic framework for MIL-1246 and introduce the issues that need to be addressed before a complete ISO standard for particulate contamination of optics can be issued. It is also hoped that this paper will stimulate discussion leading to a more complete and useful standard.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan W. Arenberg "Characterization of particulate contamination of optics", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.472003
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KEYWORDS
Particles

Standards development

Contamination

Picture Archiving and Communication System

Fourier transforms

Laser optics

Particle contamination

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