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30 May 2003 Characterizing CaF2 for VUV optical components: roughness, surface scatter, and bulk scatter
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Abstract
Methods for evaluating the quality of CaF2 substrates for vacuum ultraviolet (VUV) low loss optical components are presented. Today superpolished CaF2 is available. However, major differences might still occur between batches and careful control is therefore necessary. By using roughness data from AFM measurements combined with total scattering measurements at 193 nm and 157 nm surface roughness as well as inhomogeneities in the bulk of the material can be studied. Results are also presented of anti-reflective (AR) and highly reflective (HR) multilayer coatings on CaF2 where reduced total backscatter scattering was found for the AR-coating as compared to the substrate.
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Annette Hultaker, Nils Benkert, Stefan Gliech, and Angela Duparre "Characterizing CaF2 for VUV optical components: roughness, surface scatter, and bulk scatter", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.472392
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