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30 May 2003 Damage behavior of SiO2 thin films containing gold nanoparticles lodged at predetermined distances from the film surface
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Abstract
The impact of absorbing defect location inside thin film on measured laser-damage threshold and morphology is explored, using gold nanoparticles as artificial thin-film defects. In this work, 351-nm, 0.5-ns laser pulses were used to produce damage in SiO2 thin film containing gold nanoparticles located at predetermined but different distances from the film surface. As a result, laser-induced damage thresholds detected by means of dark-field optical microscopy and atomic force microscopy are measured and comparative trends are analyzed. Damage-crater geometry variations with particle-lodging depth are also obtained and compared with theoretical predictions.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Semyon Papernov and Ansgar W. Schmid "Damage behavior of SiO2 thin films containing gold nanoparticles lodged at predetermined distances from the film surface", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.480065
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