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30 May 2003 Degradation of a multilayer dielectric filter as a result of simulated space environmental exposure
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Abstract
The exterior optical surfaces of satellites are directly exposed to the harsh space environment. Here, a multilayer dielectric solar rejection filter was deposited on a silicon substrate and then subjected to electron and proton irradiation, simulating an orbital environment. Following the exposure, damage was observed that was attributed to dielectric breakdown. Optical and scanning electron microscopy revealed extensive pitting as a result of this exposure. The typical size of dischrage pits was 50 - 100 microns at the surface, extending to the substrate material, where a 10 micron diameter melt region was found. Pit damage occurred at pre-existing coating defects and was accelerated by pre-exposure to proton radiation. Pitting was not observed on similar samples that had also been overcoated with a conductive thin-film.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter D. Fuqua, Nathan Presser, James D. Barrie, Michael J. Meshishnek, and Dianne J. Coleman "Degradation of a multilayer dielectric filter as a result of simulated space environmental exposure", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.474853
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