High-precision reflectivity measurements: improvements in the calibration procedure

Marco Jupe; Florian Grossmann; Kai Starke; Detlev Ristau

doi:10.1117/12.472382

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30 May 2003 High-precision reflectivity measurements: improvements in the calibration procedure

Marco Jupe; Florian Grossmann; Kai Starke; Detlev Ristau

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Proceedings Volume 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization; (2003) https://doi.org/10.1117/12.472382
Event: XXXIV Annual Symposium on Optical Materials for High Power Lasers: Boulder Damage Symposium, 2002, Boulder, CO, United States

Abstract

The development of high quality optical components is heavily depending on precise characterization procedures. The reflectance and transmittance of laser components are the most important parameters for advanced laser applications. In the industrial fabrication of optical coatings, quality management is generally insured by spectral photometric methods according to ISO/DIS 15386 on a medium level of accuracy. Especially for high reflecting mirrors, a severe discrepancy in the determination of the absolute reflectivity can be found for spectral photometric procedures. In the first part of the CHOCLAB project, a method for measuring reflectance and transmittance with an enhanced precision was developed, which is described in ISO/WD 13697. In the second part of the CHOCLAB project, the evaluation and optimization for the presented method is scheduled. Within this framework international Round-Robin experiment is currently in progress. During this Round-Robin experiment, distinct deviations could be observed between the results of high precision measurement facilities of different partners. Based on the extended experiments, the inhomogeneity of the sample reflectivity was identified as one important origin for the deviation. Consequently, this inhomogeneity is also influencing the calibration procedure. Therefore, a method was developed that allows the calibration of the chopper blade using always the same position on the reference mirror. During the investigations, the homogeneity of several samples was characterized by a surface mapping procedure for 1064 nm. The measurement facility was extended to the additional wavelength 532 nm and a similar set-up was assembled at 10.6 μm. The high precision reflectivity procedure at the mentioned wavelengths is demonstrated for exemplary measurements.

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Marco Jupe, Florian Grossmann, Kai Starke, and Detlev Ristau "High-precision reflectivity measurements: improvements in the calibration procedure", Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); https://doi.org/10.1117/12.472382

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