Paper
27 May 2003 Application of artificial neural network in holographic and speckle interferometry
Janos Kornis, Gabor Vasarhelyi
Author Affiliations +
Proceedings Volume 4933, Speckle Metrology 2003; (2003) https://doi.org/10.1117/12.516635
Event: Speckle Metrology 2003, 2003, Trondheim, Norway
Abstract
Applications of artificial neural network in holographic interferometry and speckle metrology have been presented. Back-propagation neural network has been used for defect detection. Self-organizing networks has been successfully applied to determine interferometric fringe centerlines.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Janos Kornis and Gabor Vasarhelyi "Application of artificial neural network in holographic and speckle interferometry", Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); https://doi.org/10.1117/12.516635
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Cited by 2 scholarly publications.
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KEYWORDS
Neurons

Neural networks

Holographic interferometry

Holography

Speckle pattern

Artificial neural networks

Brain mapping

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