27 May 2003 Application of artificial neural network in holographic and speckle interferometry
Author Affiliations +
Proceedings Volume 4933, Speckle Metrology 2003; (2003) https://doi.org/10.1117/12.516635
Event: Speckle Metrology 2003, 2003, Trondheim, Norway
Abstract
Applications of artificial neural network in holographic interferometry and speckle metrology have been presented. Back-propagation neural network has been used for defect detection. Self-organizing networks has been successfully applied to determine interferometric fringe centerlines.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Janos Kornis, Janos Kornis, Gabor Vasarhelyi, Gabor Vasarhelyi, } "Application of artificial neural network in holographic and speckle interferometry", Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); doi: 10.1117/12.516635; https://doi.org/10.1117/12.516635
PROCEEDINGS
6 PAGES


SHARE
Back to Top