27 May 2003 Detection of faults in interferometric fringe patterns by optical wavelet filtering
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Proceedings Volume 4933, Speckle Metrology 2003; (2003) https://doi.org/10.1117/12.516636
Event: Speckle Metrology 2003, 2003, Trondheim, Norway
Abstract
In this paper the dynamic processing of interferometric fringe patterns obtained by real-time optical measurement methods like holographic interferometry is shown. A hologram of the tested component is superimposed with the hologram of the stressed component. The achieved fringe patterns vary according to the degree of stress applied. To evaluate these varying fringe patterns in real time, dynamic filtering is required. A hybrid opto-electronic sytem with a digital image processing and optical correlation module based on liquid-crystal spatial light modulators gives us the possibility to use dynamic filters and input images. In order to process interferometric fringes the adaptive wavelet transformation is applied.
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Guenther K.G. Wernicke, Frank Kallmeyer, S. Krueger, Hartmut Gruber, Daniel Kayser, "Detection of faults in interferometric fringe patterns by optical wavelet filtering", Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); doi: 10.1117/12.516636; https://doi.org/10.1117/12.516636
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