Paper
27 May 2003 Essential features of residual stress determination in thin-walled plane structures in a base of whole field interferometric measurements
Vladimir S. Pisarev, I. Odintsev, V. Balalov, A. Apalkov
Author Affiliations +
Proceedings Volume 4933, Speckle Metrology 2003; (2003) https://doi.org/10.1117/12.516626
Event: Speckle Metrology 2003, 2003, Trondheim, Norway
Abstract
Sophisticated technique for reliable quantitative deriving residual stress values from initial experimental data, which are inherent in combined implementing the hole drilling method with both holographic and speckle interferometry, is described in detail. The approach developed includes both possible ways of obtaining initial experimental information. The first of them consists of recording a set of required interference fringe patterns, which are resulted from residual stress energy release after through hole drilling, in two orthogonal directions that coincide with principal strain directions. The second way is obtaining a series of interrelated fringe patterns when a direction of either observation in reflection hologram interferometry or dual-beam illumination in speckle interferometry lies arbitrary with respect to definite principal strain direction. A set of the most typical both actual and analogous reference fringe patterns, which are related to both reflection hologram and dual-beam speckle interferometry, are presented.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir S. Pisarev, I. Odintsev, V. Balalov, and A. Apalkov "Essential features of residual stress determination in thin-walled plane structures in a base of whole field interferometric measurements", Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); https://doi.org/10.1117/12.516626
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KEYWORDS
Remote sensing

Fringe analysis

Interferometry

Holographic interferometry

Holograms

Holography

Speckle interferometry

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