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27 May 2003 Fringe analysis today and tomorrow
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Proceedings Volume 4933, Speckle Metrology 2003; (2003) https://doi.org/10.1117/12.516628
Event: Speckle Metrology 2003, 2003, Trondheim, Norway
Abstract
This paper provides an overview of the current state-of-the-art in fringe pattern analysis, with a particular emphasis on recent developments in digital speckle pattern interferometry (DSPI) and digital speckle photography (DSP). The main topics covered are as follows: spiral transform for analysis of fringe patterns without spatial carriers, real-time analysis, dynamic DSPI, three-dimensional phase unwrapping, combined DSPI/DSP techniques, and three-dimensional DSP. Several interesting applications outside mainstream speckle metrology are also described, including fingerprint analysis, and measurement of both strain and magnetic fields within the human brain using phase contrast magnetic resonance imaging (MRI).
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonathan Mark Huntley "Fringe analysis today and tomorrow", Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); https://doi.org/10.1117/12.516628
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