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27 May 2003 Phase singularities in dynamic speckle fields and their applications to optical metrology
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Proceedings Volume 4933, Speckle Metrology 2003; (2003) https://doi.org/10.1117/12.516629
Event: Speckle Metrology 2003, 2003, Trondheim, Norway
Abstract
Instead of the intensity information used in conventional speckle metrology, we explore new possibilities of making use of the phase information of speckle patterns. We propose a new technique of displacement measurement that makes use of the phase singularities in the analytic signal of the speckle pattern, which is generated by Hilbert filtering. Experimental results are presented that demonstrate the validity and the limitation of the proposed technique.
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Wei Wang, Mitsuo Takeda, Nobuo Ishii, and Yoko Miyamoto "Phase singularities in dynamic speckle fields and their applications to optical metrology", Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); https://doi.org/10.1117/12.516629
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