Tube junction study by electronic speckle pattern interferometry

Alfredo Moreno Yeras

doi:10.1117/12.516664

27 May 2003 Tube junction study by electronic speckle pattern interferometry

Alfredo Moreno Yeras

Proceedings Volume 4933, Speckle Metrology 2003; (2003) https://doi.org/10.1117/12.516664
Event: Speckle Metrology 2003, 2003, Trondheim, Norway

Abstract

The introduction of new materials in Mechanical Engineering is one of the main tasks of scientists and engineers. At present new technologies that allow the study, characterization and measurement of important mechanical states in new materials are being developed continuously. These techniques include the Optical Techniques of Measurement that use laser as an important tool in the information processing and interpretation. These techniques also involve the Electronic Speckle Pattern Interferometry (ESPI). The present investigation shows the development and implementation of ESPI technique in the study and characterization of composite tube junction. The technical characteristics related to this technique implementation are included in this paper. The strain field caused by different applied actions is also presented. The advantages and disadvantages of the use of this technique are shown and they are compared to other traditional and optical measurement techniques.

Citation Download Citation

Alfredo Moreno Yeras "Tube junction study by electronic speckle pattern interferometry", Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); https://doi.org/10.1117/12.516664

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