Paper
13 November 2002 Observation under the gradually increasing cyclic loading of yielding region of the circular hole vicinity
Kensuke Ichinose, Yuji Funamoto, Kenji Gomi, Kiyoshi Taniuchi, Katsumi Fukuda
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Proceedings Volume 4934, Smart Materials II; (2002) https://doi.org/10.1117/12.469183
Event: SPIE's International Symposium on Smart Materials, Nano-, and Micro- Smart Systems, 2002, Melbourne, Australia
Abstract
Under the cyclic loading, stress concentration takes place in the member with circular hole, and it affected to fatigue fracture. Therefore, it is important to obtain the information on the stress concentration of circular hole in the study of fatigue fracture. In the carbon steel strip, it is well known under static loading that Luders' lines which arose by yield stress in the member surface and observed easily by naked eyes exists. The same phenomenon takes place by application of cyclic loading at load ratio: R=0. The direct observation using Luders' lines becomes visible smart sensor that discerns the yielding region. This method is using the property of material itself, and it is a simple method. And, the continuous change of the member surface can discern real-time. The purpose of this study is to obtain basic data on the stress concentation of the vicinity of circular hole by observing the continuous change of the specimen surface in R=0, -1, using the carbon steel strip with a circular hole. And, the stress concentration factor required by FEM analysis and experiment was compared, when yield criterion was changed.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kensuke Ichinose, Yuji Funamoto, Kenji Gomi, Kiyoshi Taniuchi, and Katsumi Fukuda "Observation under the gradually increasing cyclic loading of yielding region of the circular hole vicinity", Proc. SPIE 4934, Smart Materials II, (13 November 2002); https://doi.org/10.1117/12.469183
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KEYWORDS
Finite element methods

Carbon

Smart sensors

Surface roughness

Eye

Fluctuations and noise

Chemical analysis

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