13 November 2002 Single-shot selective laser micromachining of filtered arc deposited TiN films from chromium underlayer
Author Affiliations +
Abstract
This paper presents the results on single-shot laser micromachining of filtered arc deposited TiN films and compares the machining characteristics of the films deposited under partially and fully filtered conditions. Machining performance was evaluated in terms of patterning quality and the ability to perform selective removal of top TiN film with minimal interference to an underlying layer. TiN was arc-deposited onto silicon substrate with a chromium layer on the top. These films were analysed for their composition and microstructure using Rutherford Backscattering Spectroscopy (RBS) and Scanning Electron Microscopy (SEM) before and after laser machining. Under single shot conditions the effect of fluence on the machined features has been investigated. The results showed selective removal of TiN films with a single shot from the underlying Cr layer. Further, this work clearly shows a distinction between the laser machining characteristics of the films deposited under different filtering conditions and substrate temperatures.
© (2002) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew John Dowling, Muralidhar K. Ghantasala, Peter E. Evans, Jason P. Hayes, Erol C. Harvey, E. Derry Doyle, "Single-shot selective laser micromachining of filtered arc deposited TiN films from chromium underlayer", Proc. SPIE 4934, Smart Materials II, (13 November 2002); doi: 10.1117/12.469051; https://doi.org/10.1117/12.469051
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT

Laser-LIGA for Serpentine Ni Microstructure
Proceedings of SPIE (November 21 2001)
Microstructuring by excimer laser
Proceedings of SPIE (September 19 1995)
Excimer laser micromachining of structures using SU-8
Proceedings of SPIE (August 30 1999)

Back to Top