Paper
15 April 2003 Laser micromachining of thin films for optoelectronic devices and packages
David F. Moore, John A. Williams, Matthew A. Hopcroft, Billy Boyle, Johnny H. He, Richard R. A. Syms
Author Affiliations +
Abstract
Focused laser micromachining in an optical microscope system is used to prototype packages for optoelectronic devices and to investigate new materials with potential applications in packaging. Micromachined thin fims are proposed as mechanical components to locate fibers and other optical and electrical components on opto-assemblies. This paper reports prototype structures which are micromachined in silicon carbide to produce beams 5 μm thick by (1) laser cutting a track in a SiC coated Si wafer, (2) undercutting by anisotropic silicon etching using KOH in water, and (3) trimming if necessary with the laser system. This approach has the advantage of fast turn around and proof of concept. Mechanical test data are obtained from the prototype SiC beam package structures by testing with a stylus profilometer. The Youngs modulus obtained for chemical vapor deposited silicon carbide is 360 +/- 50 GPa indicating that it is a promising material for packaging applications.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David F. Moore, John A. Williams, Matthew A. Hopcroft, Billy Boyle, Johnny H. He, and Richard R. A. Syms "Laser micromachining of thin films for optoelectronic devices and packages", Proc. SPIE 4941, Laser Micromachining for Optoelectronic Device Fabrication, (15 April 2003); https://doi.org/10.1117/12.468490
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CITATIONS
Cited by 10 scholarly publications and 4 patents.
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KEYWORDS
Silicon carbide

Silicon

Etching

Laser cutting

Micromachining

Packaging

Prototyping

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