3 April 2003 Bragg reflector for optical high-voltage sensor applications
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Proceedings Volume 4944, Integrated Optical Devices: Fabrication and Testing; (2003); doi: 10.1117/12.468307
Event: Photonics Fabrication Europe, 2002, Bruges, Belgium
Abstract
Optical measurement of voltage because of its excellent advantages is studied by several research groups. In this paper, two optically voltage measurement method based on periodic structure have been introduced. First one is based on Bragg reflection effect. The coefficient of reflection from a periodic layered medium depends on properties of periodic structure. In this work a periodic structure on LiNbO3 substrate was considered and under a high voltage electric field perpendicular to surface of layers, refractive indices of substrate have been changed. Performance of reflection versus applied electric field was calculated. Second method was based on Guided-mode resonance effect. Guided mode resonance effects in waveguide grating structures results in sharp variations in the intensity of the observable propagation waves. When a waveguide grating structure is illuminated with an incident light beam, part of the beam is directly transmitted and part is diffracted and trapped in waveguide layer. The trapped light is then rediffracted and it can interfere destructively with the transmitted or reflected light and show transmission or reflection anomalies. This phenomenon is sensitive to constitutive parameters of structure; therefore, it can be used in order to electro-optic voltage measurement.
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Hamid Reza Azarinia, Khashayar Mehrany, Bizhan Rashidian, Ahad Tavakkoli, "Bragg reflector for optical high-voltage sensor applications", Proc. SPIE 4944, Integrated Optical Devices: Fabrication and Testing, (3 April 2003); doi: 10.1117/12.468307; https://doi.org/10.1117/12.468307
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KEYWORDS
Reflection

Waveguides

Sensors

Reflectors

Refractive index

Diffraction gratings

Electric field sensors

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