3 April 2003 Design of a test set for characterization of optical devices in silica-based optical integrated circuit technology
Author Affiliations +
Abstract
One of the main problems in modeling guided wave devices in silica is the determination of the proper input parameters to the model. In this paper, we propose a method to determine five critical parameters: the depth, the length, the refractive index, the loss, and the thermo-optic coefficient of the silica waveguide. The finite difference method is used for the calculation of the optical modes in waveguides with a step index profile. The Beam Propagation Method (BPM) is used to analyze the test structures of the test-chip. The test set includes a planar waveguide, a symmetric Mach-Zehnder structure, an asymmetric Mach-Zehnder structure, and a series of planar waveguides with different lengths. This test-set is designed based on 1um Optical Integrated Circuit (OIC) technology.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Khadijeh Bayat, Mahdi Farrokh Baroughi, Nosratollah Granpayeh, "Design of a test set for characterization of optical devices in silica-based optical integrated circuit technology", Proc. SPIE 4944, Integrated Optical Devices: Fabrication and Testing, (3 April 2003); doi: 10.1117/12.472448; https://doi.org/10.1117/12.472448
PROCEEDINGS
12 PAGES


SHARE
Back to Top