3 April 2003 Design of a test set for characterization of optical devices in silica-based optical integrated circuit technology
Author Affiliations +
Proceedings Volume 4944, Integrated Optical Devices: Fabrication and Testing; (2003); doi: 10.1117/12.472448
Event: Photonics Fabrication Europe, 2002, Bruges, Belgium
Abstract
One of the main problems in modeling guided wave devices in silica is the determination of the proper input parameters to the model. In this paper, we propose a method to determine five critical parameters: the depth, the length, the refractive index, the loss, and the thermo-optic coefficient of the silica waveguide. The finite difference method is used for the calculation of the optical modes in waveguides with a step index profile. The Beam Propagation Method (BPM) is used to analyze the test structures of the test-chip. The test set includes a planar waveguide, a symmetric Mach-Zehnder structure, an asymmetric Mach-Zehnder structure, and a series of planar waveguides with different lengths. This test-set is designed based on 1um Optical Integrated Circuit (OIC) technology.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Khadijeh Bayat, Mahdi Farrokh Baroughi, Nosratollah Granpayeh, "Design of a test set for characterization of optical devices in silica-based optical integrated circuit technology", Proc. SPIE 4944, Integrated Optical Devices: Fabrication and Testing, (3 April 2003); doi: 10.1117/12.472448; https://doi.org/10.1117/12.472448
PROCEEDINGS
12 PAGES


SHARE
KEYWORDS
Waveguides

Prisms

Refractive index

Silica

Thermal optics

Mach-Zehnder interferometers

Beam propagation method

Back to Top