III-V microsystems for infrared imaging and spectroscopic applications

Jan P. Vermeiren

doi:10.1117/12.476896

11 March 2003 III-V microsystems for infrared imaging and spectroscopic applications

Jan P. Vermeiren

Author Affiliations +

Proceedings Volume 4947, Laser Diodes, Optoelectronic Devices, and Heterogenous Integration; (2003) https://doi.org/10.1117/12.476896
Event: Photonics Fabrication Europe, 2002, Bruges, Belgium

Abstract

During the last years, great progress has been made in all disciplines related to the realization of III-V based Infrared detectors. As a consequence, these detectors have become mature and they have the potential to cope with the competition of II-VI or IV-VI based IR detectors. Due to the wide variety of III-V material systems, one can cover a wavelengths range from the UV to the second thermal window. Due to the improved material quality, the requirements on read-out circuitry and on the packaging of IR sensor chips become more and more important; this necessitates the user to approach the design and verification of a sensor chip from a system perspective instead of concentrating on the device physics.

Citation Download Citation

Jan P. Vermeiren "III-V microsystems for infrared imaging and spectroscopic applications", Proc. SPIE 4947, Laser Diodes, Optoelectronic Devices, and Heterogenous Integration, (11 March 2003); https://doi.org/10.1117/12.476896

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE