1 August 2003 Investigation on EBI and secondary electron emission in streak tubes
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Proceedings Volume 4948, 25th International Congress on High-Speed Photography and Photonics; (2003) https://doi.org/10.1117/12.516877
Event: 25th international Congress on High-Speed photography and Photonics, 2002, Beaune, France
Abstract
The investigations of residual gas influence on EBI in streak tubes were continued. Model of the microdischarges in streak tubes, grounded on the theory of reciprocal ion emission is considered and it was shown, it is agree with experimental data on EBI fluctuations. The secondary electron emission from a material of an anode diaphragm was detected and investigated.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vyacheslav M. Senkov, Vyacheslav M. Senkov, Valentina P. Degtyareva, Valentina P. Degtyareva, Nadejda D. Polikarkina, Nadejda D. Polikarkina, Alla N. Khoklova, Alla N. Khoklova, Zoya M. Semichastnova, Zoya M. Semichastnova, } "Investigation on EBI and secondary electron emission in streak tubes", Proc. SPIE 4948, 25th International Congress on High-Speed Photography and Photonics, (1 August 2003); doi: 10.1117/12.516877; https://doi.org/10.1117/12.516877
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