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9 July 2003 High-resolution three-dimensional imaging using multiple nanometric probes
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Abstract
We present a new imaging modality using nanometric beads as multiple local probes. The positions of the beads are determined in three dimensions using white-light interference microscopy, by over-sampling and fitting the images. We measured the deformation of a Laponite gel with 100 nm resolution.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Arnaud Dubois, Gael Moneron, Romain Lecaque, Francois Lequeux, and Albert-Claude Boccara "High-resolution three-dimensional imaging using multiple nanometric probes", Proc. SPIE 4964, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing X, (9 July 2003); doi: 10.1117/12.477973; https://doi.org/10.1117/12.477973
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