Latest Techniques - Low Light Level Sensors

Dennis E. Caudle

doi:10.1117/12.944488

2 November 1984 Latest Techniques - Low Light Level Sensors

Dennis E. Caudle

Proceedings Volume 0497, High Speed Photography, Videography, and Photonics II; (1984) https://doi.org/10.1117/12.944488
Event: 28th Annual Technical Symposium, 1984, San Diego, United States

Abstract

This paper describes the latest techniques used in the development and construction of two unique types of low-light level sensors. Both sensors operate in the visible and near I.R. (infrared) spectrum but address divergent design goals, architectures, and construction. The first sensor is based on custom single micro-channel plate intensification of the C.I.D. (charge injection device)6solid-state self scanning array. Design and performance goals emphasize sensitivity (10^-6 F.C.), MTF, miniturization (0.0258 cu.ft.), ruggedness, integration and gating. The second sensor is based on custom dual micro-channel plate intensification of a modi-fied silicon array tube. Design and performance goals emphasize sensitivity (10^-8 F.C.), intrascene dynamic range (1x10⁸) and blooming. Both sensors are described in terms of architectures, physical structure, performance and design trade offs.

Citation Download Citation

Dennis E. Caudle "Latest Techniques - Low Light Level Sensors", Proc. SPIE 0497, High Speed Photography, Videography, and Photonics II, (2 November 1984); https://doi.org/10.1117/12.944488

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