5 June 2003 Diode laser-based diagnostic for NCl(X)
Author Affiliations +
Proceedings Volume 4971, Gas and Chemical Lasers and Intense Beam Applications IV; (2003) https://doi.org/10.1117/12.483500
Event: High-Power Lasers and Applications, 2003, San Jose, CA, United States
We present preliminary results of an effort to develop an ultra-sensitive, diode laser-based diagnostic for NCl(X), an important species in the all gas phase iodine laser. This system uses a narrow band, tunable diode laser to probe transitions within the (0,0) band of the NCl(b - X) system near 662 nm. We provide a description of our detection and calibration strategies and present initial calibration results.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Steven J. Davis, Phillip A. Mulhall, William J. Kessler, Michael C. Heaven, Gerald C. Manke, "Diode laser-based diagnostic for NCl(X)", Proc. SPIE 4971, Gas and Chemical Lasers and Intense Beam Applications IV, (5 June 2003); doi: 10.1117/12.483500; https://doi.org/10.1117/12.483500

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