5 June 2003 Diode laser-based diagnostic for NCl(X)
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Proceedings Volume 4971, Gas and Chemical Lasers and Intense Beam Applications IV; (2003); doi: 10.1117/12.483500
Event: High-Power Lasers and Applications, 2003, San Jose, CA, United States
Abstract
We present preliminary results of an effort to develop an ultra-sensitive, diode laser-based diagnostic for NCl(X), an important species in the all gas phase iodine laser. This system uses a narrow band, tunable diode laser to probe transitions within the (0,0) band of the NCl(b - X) system near 662 nm. We provide a description of our detection and calibration strategies and present initial calibration results.
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Steven J. Davis, Phillip A. Mulhall, William J. Kessler, Michael C. Heaven, Gerald C. Manke, "Diode laser-based diagnostic for NCl(X)", Proc. SPIE 4971, Gas and Chemical Lasers and Intense Beam Applications IV, (5 June 2003); doi: 10.1117/12.483500; https://doi.org/10.1117/12.483500
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KEYWORDS
Absorption

Diagnostics

Iodine

iodine lasers

Semiconductor lasers

Sensors

Calibration

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