19 June 2003 High-power diode array reliability experiment
Author Affiliations +
Proceedings Volume 4973, High-Power Diode Laser Technology and Applications; (2003) https://doi.org/10.1117/12.501865
Event: High-Power Lasers and Applications, 2003, San Jose, CA, United States
Abstract
Performance degradation and lifetimes of high power diode arrays are important issues for laser manufacturers and end users. To fully understand these issues long term testing and failure analysis of arrays is required. To perform this testing we have set up an automated lifetime experiment to examine the characteristics of high power arrays over time. Subsequent material analysis of the arrays will uncover failure mechanisms.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David J. Gallant, David J. Gallant, John Boeckl, John Boeckl, "High-power diode array reliability experiment", Proc. SPIE 4973, High-Power Diode Laser Technology and Applications, (19 June 2003); doi: 10.1117/12.501865; https://doi.org/10.1117/12.501865
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT

PVRessQ! a research activity on reliability of PV systems...
Proceedings of SPIE (September 21 2011)
650 nm tapered lasers with 1 W maximum output power...
Proceedings of SPIE (February 12 2008)
Diode array reliability experiment
Proceedings of SPIE (May 31 2004)
Characterization of high-power quasi-cw laser diode arrays
Proceedings of SPIE (September 12 2005)

Back to Top