4 June 2003 Measurement of nonlinear characteristics of silver-halide holographic materials by phase-contrast microscopy
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Proceedings Volume 5005, Practical Holography XVII and Holographic Materials IX; (2003); doi: 10.1117/12.473953
Event: Electronic Imaging 2003, 2003, Santa Clara, CA, United States
Abstract
Lin-curves of plane-wave phase holograms recorded in Agfa-Gevaert 8E75HD emulsions were measured for the combinations of AAC developer and the R9 bleaching agent. Then each holographic grating was studied by phase-contrast microscopy, using both medium-power (40 X) and high-power immersion (100 X) objectives. Thus, besides of the Lin-curves, the modulation of the refractive index as a function of the bias exposure and the visibility of the recording interference pattern can also been determined. This latter characteristics is used in coupled wave theory to calculate the diffraction efficiency of holographic gratings, thus the measured diffraction efficiencies can be compared to those predicted by the theory. Moreover, this direct study of the phase profile of the gratings can be used for optimising processing.
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Istvan Banyasz, "Measurement of nonlinear characteristics of silver-halide holographic materials by phase-contrast microscopy", Proc. SPIE 5005, Practical Holography XVII and Holographic Materials IX, (4 June 2003); doi: 10.1117/12.473953; https://doi.org/10.1117/12.473953
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KEYWORDS
Holograms

Microscopy

Holography

Phase contrast

Modulation

Photomicroscopy

Diffraction

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