Tunnel profile measurement by vision metrology toward application to NATM

Susumu Hattori; Keiichi Akimoto; Tetsu Ono; Satoru Miura

doi:10.1117/12.477510

22 May 2003 Tunnel profile measurement by vision metrology toward application to NATM

Susumu Hattori, Keiichi Akimoto, Tetsu Ono, Satoru Miura

Proceedings Volume 5011, Machine Vision Applications in Industrial Inspection XI; (2003) https://doi.org/10.1117/12.477510
Event: Electronic Imaging 2003, 2003, Santa Clara, CA, United States

Abstract

The NATM, a widely used tunnel excavation method, requires precise periodical monitoring of deformations especially at fault zones, which tends to hamper traffics with conventional measurement means. In this paper vision metrology was applied to tunnel profile measurement with a view to developing a new method. Two hundred of Retro-targets are placed on a one-meter spacing lattice at a tunnel site of 7m in diameter and 15m in longitude, and 66 images were taken to cover the target field. The object space coordinates of targets obtained by bundle adjustment were compared with ones obtained by high-precision total station observation. The root mean square (RMS) of differences of coordinates was 0.548mm, which is precise enough for monitoring deformations for the NATM.

Citation Download Citation

Susumu Hattori, Keiichi Akimoto, Tetsu Ono, and Satoru Miura "Tunnel profile measurement by vision metrology toward application to NATM", Proc. SPIE 5011, Machine Vision Applications in Industrial Inspection XI, (22 May 2003); https://doi.org/10.1117/12.477510

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