Using a high-speed camera to discriminate projective lines with an adverse illumination

Tadeusz Sliwa; Yvon Voisin; Alan Diou

doi:10.1117/12.474014

22 May 2003 Using high-speed camera to discriminate projective line with an adverse illumination

Tadeusz Sliwa, Yvon Voisin, Alan Diou

Proceedings Volume 5011, Machine Vision Applications in Industrial Inspection XI; (2003) https://doi.org/10.1117/12.474014
Event: Electronic Imaging 2003, 2003, Santa Clara, CA, United States

Abstract

Scanning techniques combining laser line projection with motion are simple and efficient. But there are number of cases in which laser triangulation fails. Some have well known solutions. Other, like adverse illumination by intense white light or presence of textures make laser projection hard to distinguish, and have no specific solution. In this article, a method is presented to improve retrieving laser projection for those cases. It’s build upon two main ideas. First, using auxiliary lines to create local high frequencies. Second, Transform a high speed camera in an intensity modulation receiver. The principle is to send a periodic message in the lines intensity and try to track traces of a spatial-temporal deforming pattern in the video sequences produced by the camera. It permits two main improvements. First, when adverse illumination produce other lines, they can be discriminate by the fact they don’t send the message. Second, when adverse illumination produce a highly luminous image or when a texture diffuse a part of the laser energy, it’s sufficient to track the noise of the message. By choosing a message, it’s possible to create every type of noise in order to distinguish it between the rest of image noises.

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Tadeusz Sliwa, Yvon Voisin, and Alan Diou "Using high-speed camera to discriminate projective line with an adverse illumination", Proc. SPIE 5011, Machine Vision Applications in Industrial Inspection XI, (22 May 2003); https://doi.org/10.1117/12.474014

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KEYWORDS

Cameras

Imaging systems

High speed cameras

Inspection

Light sources and illumination

Modulation

Profilometers

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