Adaptive pixel defect correction

Anthony West Rynes; Arjen van der Sijde; Bart Dillen; Albert J. P. Theuwissen; Wim de Haan

doi:10.1117/12.499223

16 May 2003 Adaptive pixel defect correction

Anthony West Rynes, Arjen van der Sijde, Bart Dillen, Albert J. P. Theuwissen, Wim de Haan

Proceedings Volume 5017, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV; 501701 (2003) https://doi.org/10.1117/12.499223
Event: Electronic Imaging 2003, 2003, Santa Clara, CA, United States

Abstract

Although the number of pixels in image sensors is increasing exponentially, production techniques have only been able to linearly reduce the probability that a pixel will be defective. The result is a rapidly increasing probability that a sensor will contain one or more defective pixels. Sensors with defects are often discarded after fabrication because they may not produce aesthetically pleasing images. To reduce the cost of image sensor production, defect correction algorithms are needed that allow the utilization of sensors with bad pixels. We present a relatively simple defect correction algorithm, requiring only a small 7 by 7 kernel of raw color filter array data that effectively corrects a wide variety of defect types. Our adaptive edge algorithm is high quality, uses few image lines, is adaptable to a variety of defect types, and independent of other on-board DSP algorithms. Results show that the algorithm produces substantially better results in high-frequency image regions compared to conventional one-dimensional correction methods.

Citation Download Citation

Anthony West Rynes, Arjen van der Sijde, Bart Dillen, Albert J. P. Theuwissen, and Wim de Haan "Adaptive pixel defect correction", Proc. SPIE 5017, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV, 501701 (16 May 2003); https://doi.org/10.1117/12.499223

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