Paper
11 June 2003 Auger recombination in strained InGaAsP quantum wells with Eg = 0.7-1.6 eV
Z. N. Sokolova, D. I. Gurylev, Nikita A. Pikhtin, Ilya S. Tarasov
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Abstract
Auger coefficients have been measured in five light emitting diodes (LEDs) with strained quantum wells in active region covered a wide range of wavelength. LED were fabricated from identical high efficient laser heterostructures. The obtained Auger coefficients increase from 3 x 10-30 to 1.8 x 10-28 cm6/c as wavelength changes from 0.78 to 1.8 μm.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Z. N. Sokolova, D. I. Gurylev, Nikita A. Pikhtin, and Ilya S. Tarasov "Auger recombination in strained InGaAsP quantum wells with Eg = 0.7-1.6 eV", Proc. SPIE 5023, 10th International Symposium on Nanostructures: Physics and Technology, (11 June 2003); https://doi.org/10.1117/12.513820
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KEYWORDS
Quantum wells

Light emitting diodes

Heterojunctions

Semiconductor lasers

Broad area laser diodes

Nanostructures

Optical testing

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