11 June 2003 Spectral speckle analysis: a new method to measure coherence and dephasing in semiconductor nanostructures
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Abstract
A new method to measure the coherence of inhomogeneously broadened optical excitations in semiconductor nanostructures is presented. The secondary emission of excitons in semiconductor quantum wells is investigated. The spectrally-resolved coherence degree of resonantly-excited light emission is deduced from the intensity fluctuations over the emission directions (speckles). The spectral correlations of the speckles give direct access to the homogeneous line width as function of spectral position within the inhomogeneously broadened ensemble. The combination of static disorder and phonon scattering leads to a partially coherent emission. The temperature dependence of the homogeneous line width is well explained by phonon scattering.
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G. Kocherscheidt, Wolfgang W. Langbein, Roland Zimmermann, "Spectral speckle analysis: a new method to measure coherence and dephasing in semiconductor nanostructures", Proc. SPIE 5023, 10th International Symposium on Nanostructures: Physics and Technology, (11 June 2003); doi: 10.1117/12.513755; https://doi.org/10.1117/12.513755
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