1 April 2003 Diagnostics of optical nonlinearities: spatial beam distortion technique and its application to semiconductors and novel materials
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Proceedings Volume 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (2003) https://doi.org/10.1117/12.497191
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 2003, 2003, Moscow, Russian Federation
Abstract
Development of nonlinear refraction diagnostics methods based on spatial beam distortions technique and nonlinear absorption measurements is illustrated with wide-gap semiconductors experimental data. With picosecond Z-scan technique we have studied competitive optical nonlinearities -- intraband direct equilibrium carriers transitions saturation and interband two-photon absorption (TPA) for a α-SiC(6H) crystal, and enhanced state absorption, absorption saturation and TPA -- of epoxy polymer based on diglicidyl ether of bisphenol A in a wide pumping intensities range (10 MW/cm2 - 20 GW/cm2) at 532 nm. The complexity of the analysis was dealt with the nonlinearities signatures recognition problem and selection the part of the Z-scan curve which corresponds to the dominant contribution of the proper nonlinear mechanism on the background of competitive others. The TPA coefficient is β = 3.2 ± 0.3 cm/GW for the α-SiC(6H) crystal. The TPA coefficient is β = 4.0 ± 0.5 cm/GW for the polymer. At very high laser intensities (>7 GW/cm2) photoinduced transformation into some new configuration is taken place that is more absorbent at 532 nm. The TPA coefficient is β = 16.7 ± 3 cm/GW for the photoproduct. Up to pumping irradiance of 20 GW/cm2 no optical damage of the polymer was observed.
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Anatoly A. Borshch, Anatoly A. Borshch, Mikhail S. Brodyn, Mikhail S. Brodyn, Vladimir Ya. Gayvoronsky, Vladimir Ya. Gayvoronsky, } "Diagnostics of optical nonlinearities: spatial beam distortion technique and its application to semiconductors and novel materials", Proc. SPIE 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (1 April 2003); doi: 10.1117/12.497191; https://doi.org/10.1117/12.497191
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