1 April 2003 Electromagnetic wave reflection by rough fractal surface of semiconductor materials
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Proceedings Volume 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (2003) https://doi.org/10.1117/12.497262
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 2003, 2003, Moscow, Russian Federation
Abstract
In the given work the rough surface of semiconductor is modeling by 2D fractal Wierstrass function. On the basis of the Kirchhoff scalar theory the scattering indicatrices for the some types od scattering surfaces are present. On the basis of numerical accounts average scattering coefficient the diagrams of dependence for various fractal semiconductor surfaces was constructed.
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Leonid G. Grechko, Olexander Yu. Semchuk, Victor V. Gozhenko, Anatolii A. Pinchuk, "Electromagnetic wave reflection by rough fractal surface of semiconductor materials", Proc. SPIE 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (1 April 2003); doi: 10.1117/12.497262; https://doi.org/10.1117/12.497262
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