5 June 2003 Contrast-to-noise and exposure measurements of an aSi:H/Csl(Tl) flat-panel based digital radiography system using a QC chest phantom
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Abstract
The amorphous silicon (a-Si:H) flat panel imaging systems have recently become commercially available and gained acceptance as promising candidates for implementing digital radiography. In this work, SNRs, CNRs and figure-of-merit, defined as CNR2/SEEs, were measured for a commercial a-Si:H/CsI(Tl) flat-panel digital chest radiography system as a function of the kVp for three different regions in the images of a chest phantom: lung, heart and subphrenic. Using these measurements, issues of image quality and optimal selection of the kVp are discussed.
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Xinming Liu, Xinming Liu, Chris C. Shaw, Chris C. Shaw, Peter Balter, Peter Balter, S. Cheenu Kappadath, S. Cheenu Kappadath, Chao-Jen Lai, Chao-Jen Lai, "Contrast-to-noise and exposure measurements of an aSi:H/Csl(Tl) flat-panel based digital radiography system using a QC chest phantom", Proc. SPIE 5030, Medical Imaging 2003: Physics of Medical Imaging, (5 June 2003); doi: 10.1117/12.480473; https://doi.org/10.1117/12.480473
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