5 June 2003 X-ray detection properties of polycrystalline Cd1-xZnxTe detectors for digital radiography
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Proceedings Volume 5030, Medical Imaging 2003: Physics of Medical Imaging; (2003); doi: 10.1117/12.480185
Event: Medical Imaging 2003, 2003, San Diego, California, United States
Abstract
There has been considerable recent progress in II-IV semiconductor materials and in methods for improving performance of the associated digital x-ray detectors. Cd1-xZnxTe is known as promising medical x-ray detector material. The CdTe and Cd1-xZnxTe (x=0.15,0.25,0.3) detectors were fabricated by vacuum thermal evaporator for the large area deposition. First, the stoichimetric ratio and the x-ray diffraction of the deposited (Cd,Zn)Te films were analyzed by EPMA and XRD. Secondly, leakage current, x-ray sensitivity, SNR, and linearity were measured to analyze the x-ray detection effect of Zn in (Cd,Zn)Te film. Experimental results showed that the increase of Zn concentration rates in Cd1-xZnxTe detectors reduced the leakage current and improved the x-ray detection performance.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sang Sik Kang, Ji Koon Park, Dong Gil Lee, Chi Woong Mun, Jae Hyung Kim, Sang Hee Nam, "X-ray detection properties of polycrystalline Cd1-xZnxTe detectors for digital radiography", Proc. SPIE 5030, Medical Imaging 2003: Physics of Medical Imaging, (5 June 2003); doi: 10.1117/12.480185; https://doi.org/10.1117/12.480185
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KEYWORDS
Zinc

X-ray detectors

Tellurium

Cadmium

X-rays

Sensors

Radiography

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