8 July 2003 Automatic stand for metrological certification of high-accuracy angular measuring devices
Author Affiliations +
Proceedings Volume 5036, Photonics, Devices, and Systems II; (2003) https://doi.org/10.1117/12.498329
Event: Photonics, Devices, and Systems II, 2002, Prague, Czech Republic
Abstract
Principles of automatic two-coordinate stand building are discussed. A base of using the stand is direct frequentative high-accuracy measurements of fixed angles for various zenith directions. Results of these measurements are introduced into special microprocessor for composing system of simultaneous error equations. The solution of the system makes it possible for setting both general instrumental errors of horizontal and vertical angular measurements and separate components of these errors. The system of base directions is set by two-coordinate photoelectric autocollimators aiming to special prism standard. The standard is certified beforehand and used then periodically for verification of the spatial stability of the stand. Analysis of an accuracy has illustrated that the error of certification may be not exceeded by 0,3 angular second for frequentative measurements if the error of the autocollimators are less to 0,1 angular second.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuri B. Parvulyusov, Yuri B. Parvulyusov, Valery A. Ilyuhin, Valery A. Ilyuhin, Yuri G. Yakushenkov, Yuri G. Yakushenkov, } "Automatic stand for metrological certification of high-accuracy angular measuring devices", Proc. SPIE 5036, Photonics, Devices, and Systems II, (8 July 2003); doi: 10.1117/12.498329; https://doi.org/10.1117/12.498329
PROCEEDINGS
4 PAGES


SHARE
Back to Top