16 June 2003 Scanning probe lithography
Author Affiliations +
Abstract
We present a new methodology to fabricate surface structures based on coated magnetic particles and charged polymers. We control the surface architecture via a nanolithographic approach, Dip-Pen Nanolithography, which utilizes Atomic Force Microscopy (AFM) to delivery molecular "inks" on soid substrates. This process results in surfaces with a pre-programmed architecture composed of well-characterized negatively and postively charged polymeric regions. Charged magnetic particles coated via the Layer-by-Layer method can be assembled onto the pre-programmed surface blue-print using electrostatic interactions. The possibility of incorporating our templates in simple device strategies is currently being explored.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dorjderem Nyamjav, Dorjderem Nyamjav, Albena Ivanisevic, Albena Ivanisevic, "Scanning probe lithography", Proc. SPIE 5037, Emerging Lithographic Technologies VII, (16 June 2003); doi: 10.1117/12.484991; https://doi.org/10.1117/12.484991
PROCEEDINGS
6 PAGES


SHARE
Back to Top