Visit My Account to manage your email alerts.
Nondestructive nanomechanical imaging: cross-sectional ultrasonic force microscopy of integrated circuit test structures
AFM/MFM hybrid nanocharacterization of martensitic transformation and degradation for Fe-Pd shape memory alloy
Imaging the microstructure of copper with the atomic force microscope (AFM) and ultrasonic force microscope (UFM)
Determination of polarization profiles inside ferroelectric thin films using the laser intensity modulation method
Optical interferometric measurements of the static/dynamic response characteristics of MEMS ultrasonic transducers
Processing and electrical characterization in intrinsic conducting polymers for electronic and MEMS applications
Measurement of complex permittivity of moist sawdust by perturbation method with a dielectric ring resonator