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29 April 2003 Optical image processing technology in recognizing specific trace
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Proceedings Volume 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002; (2003) https://doi.org/10.1117/12.510312
Event: Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, 2002, Beijing, China
Abstract
The surface profile is presented various, that forming cause of the specific trace is different. The specific trace is distributed as two types, from its criterion. First, the criterion of the specific trace is large, surpass a millimeter, is called grand specific trace; Second, the criterion is small, more or less the same length micron, is called micron specific trace. Using projection, contracting beam micrography, two-dimensions adusting image mode exchange, low-pass filter off noise, wavelet, and intelligent mode phase reconstruction, the surface profile of recognizing specific trace is given exactly and rapidly, that is a new optical image processing technology in recognition and diagnosis. This paper introduces the speciality above the technology and gave typical examples.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yunshan Wang, Shuchun Si, Jianqiang Xu, Canlin Zhou, and Chengyong Gao "Optical image processing technology in recognizing specific trace", Proc. SPIE 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, (29 April 2003); https://doi.org/10.1117/12.510312
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